A variety of experimental methods are employed in our research.
The PANalytical X’Pert Pro MPD is equipped with a Cu X-ray source and is primarily dedicated to temperature-dependent XRD experiments. Two temperature chambers are available, covering a temperature range from –190 °C up to 1200 °C. The instrument is used for advanced powder XRD measurements, including phase analysis and detailed structural studies of crystalline materials.
The Bruker D6 Phaser is equipped with a Cu X-ray source and is primarily used for routine powder XRD measurements, phase identification, and structural characterization of functional oxide materials. In addition to bulk powder analysis, the instrument is also suitable for the structural investigation of thin films, enabling phase analysis and crystallographic studies of both bulk and thin-film oxide systems.
In addition to the instruments available at OFM, experiments are performed in collaboration with external large-scale research facilities, including synchrotron and neutron sources.